Leveraging disposable instrumentation to reduce coverage collection overhead

Testers use coverage data for test suite quality assessment, stopping criteria definition, and effort allocation. However, as the complexity of products and testing processes increases, the cost of coverage data collection may grow significantly, jeopardizing its potential application. To mitigate this problem this paper presents the concept of “disposable coverage instrumentation” – coverage instrumentation that is removed after its execution – through two techniques: local disposal and collective disposal. A Java virtual machine was extended to support these techniques, and their potential is shown through two studies utilizing the Specjvm98 and Specjbb2000 benchmarks. The results indicate that the techniques can reduce coverage collection overhead by an order of magnitude over state of the art techniques.